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Browsing by  AuthorKim, OH
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Showing results 4 to 4 of 4
Article
The application of scanning photoelectron microscopy of the PLS (Pohang light source) to investigation of semiconductor devices
SCIE
SCOPUS
SURFACE REVIEW AND LETTERS, vol. 9, no. 1, page. 497 - 501, 2002-02
Lee, MK
;
Shin, HJ
;
Kim, GB
;
Hong, CK
;
Kim, OH
;
et al
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