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전체 가 나 다 라 마 바 사 아 자 차 카 타 파 하

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Showing results 8 to 10 of 10

Article

PBTI-associated high-temperature hot carrier degradation of nMOSFETs with metal-gate/high-k dielectricsSCIESCOPUS

IEEE ELECTRON DEVICE LETTERS, vol. 29, no. 4, page. 389 - 391, 2008-04

Article

Phase separation of Ni germanide formed on a Ge-on-Si structure for ge MOSFETsSCIESCOPUS

ELECTROCHEMICAL AND SOLID STATE LETTERS, vol. 11, no. 1, page. H1 - H1, 2008-01

Article

Time-Dependent Dielectric Breakdown of La2O3-Doped High-k/Metal Gate Stacked NMOSFETsSCIESCOPUS

IEEE ELECTRON DEVICE LETTERS, vol. 30, no. 3, page. 298 - 301, 2009-03

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