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Showing results 1 to 9 of 9
Conference
Analysis of Mechanical Stress on Charge Trap Nitride (CTN) for Program Operation in 3D NAND Flash Memory

제 30회 한국반도체학술대회, 2023-02-15

Conference
Channel Trimming Process to Improve Electro-thermal Characteristics for Sub-3-nm Node Nanosheet Field-Effect Transistors with Laser Spike Annealing

2023 International Conference on Solid State Devices and Materials (SSDM), 2023-09-08

Conference
Front-side and Back-side Power Delivery Network Guidelines for 2nm node High Perf Computing and Mobile SoC applications

2023 Symposium on VLSI Technology and Circuits, 2023-06-13

Conference
Holistic Analysis of Asymmetry in Vertical Silicon Gate-all-around Nanosheet FETs

2023 International Conference on Solid State Devices and Materials (SSDM), 2023-09-08

Article
Investigation of Electrothermal Characteristics in Silicon Forksheet FETs for Sub-3-nm NodeSCIESCOPUS

IEEE Transactions on Electron Devices, vol. 70, no. 12, page. 6132 - 6137, 2023-12

Article
Novel Scheme of Inner Spacer Length Optimization for Sub-3-nm Node Silicon n/p Nanosheet Field-Effect TransistorsSCIESCOPUS

IEEE Transactions on Electron Devices, vol. 70, no. 12, page. 6151 - 6156, 2023-12

Conference
Novel scheme to form non-uniform oxide in gate-all-around NCFETs for capacitance matching

제 30회 한국반도체학술대회, 2023-02-15

Conference
Optimization of Ge Mole Fraction in Sacrificial Layers for Sub-3-nm Node Silicon Nanosheet FETs

The 7th Electron Devices Technology and Manufacturing Conference (IEEE EDTM 2023), 2023-03-09

Conference
Sensitivity Analysis of Each Inner Spacer Thickness Variation in Sub 3-nm Node Si Nanosheet FETs

제 29회 한국반도체학술대회, 2022-01-25

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