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Browsing by AuthorChoi, Rino

전체 가 나 다 라 마 바 사 아 자 차 카 타 파 하

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Showing results 1 to 3 of 3

Article

Bias dependence of PBTI degradation mechanism in metal-oxide-semiconductor field effect transistors with La-incorporated hafnium-based dielectricSCIESCOPUS

Microelectronic Engineering, vol. 88, no. 7, page. 1373 - 1375, 2011-07

Article

Effect of Al incorporation on the performance and reliability of p-type metal-oxide-semiconductor field effect transistorsSCIESCOPUS

Thin Solid Films, vol. 521, page. 119 - 122, 2012-10-30

Article

Extremely Low Leakage Threshold Switch with Enhanced Characteristics via Ag Doping on Polycrystalline ZnO Fabricated by Facile Electrochemical Deposition for an X-Point SelectorSCIESCOPUS

ACS APPLIED ELECTRONIC MATERIALS, vol. 3, no. 5, page. 2309 - 2316, 2021-05

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