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Browsing by  AuthorChoi, Seung-Hyun

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Showing results 1 to 6 of 6
Article
An oversampling method for wafer map defect pattern classification considering small and imbalanced dataSCIESCOPUS

COMPUTERS & INDUSTRIAL ENGINEERING, vol. 162, 2021-12

Article
Approach to derive golden paths based on machine sequence patterns in multistage manufacturing processSCIESCOPUS

JOURNAL OF INTELLIGENT MANUFACTURING, vol. 33, no. 1, page. 167 - 183, 2022-01

Article
Approach to derive golden paths under time-varying machine performance in multistage manufacturing processSCIESCOPUS

JOURNAL OF MANUFACTURING SYSTEMS, vol. 61, page. 77 - 86, 2021-10

Article
Development of a spatial dimension-based taxonomy for classifying the defect patterns in a wafer bin mapSCIESCOPUS

Advanced Engineering Informatics, vol. 60, 2024-04

Article
Development of taxonomy for classifying defect patterns on wafer bin map using Bin2Vec and clustering methodsSCIESCOPUS

Computers in Industry, vol. 152, 2023-11

Article
Utilizing Electricity Consumption Data to Assess the Noise Discomfort Caused by Electrical Appliances between Neighbors: A Case Study of a Campus Apartment BuildingSCIESSCISCOPUS

Sustainability, vol. 12, no. 20, 2020-10

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