Open Access System for Information Sharing

Login Library

 

Article
Cited 8 time in webofscience Cited 8 time in scopus
Metadata Downloads

Modeling length scale effects on strain induced grain boundary migration via bridging phase field and crystal plasticity methods SCIE SCOPUS

Title
Modeling length scale effects on strain induced grain boundary migration via bridging phase field and crystal plasticity methods
Authors
Jafari, M.Jamshidian, M.Ziaei-Rad, S.Lee, B.J.
Date Issued
2019-11
Publisher
PERGAMON-ELSEVIER SCIENCE LTD
Abstract
A coupled crystal plasticity and phase field modeling framework is employed to simulate polycrystalline grain growth via static strain induced grain boundary migration. Specifically, the effect of the average grain size as a microstructural length scale on the development of microstructure and texture in columnar-grained aluminum polycrystal is examined. During annealing, subsequent to plastic tensile straining, a nearly normal grain growth regime is observed for comparatively small microstructural length scales. However, for comparatively large microstructural length scales, abnormal grain growth and development of a specific texture emerge. Hence, grain growth is found to transition from normal to abnormal by enlarging the microstructural length scale. These observations are attributed to the fact that the competing driving forces for grain boundary migration scale differently with the microstructural length scale. In addition, for the case of large microstructural length scale, a transition from abnormal to normal grain growth at later annealing times is observed. This observation is attributed to the weakening of the strain induced boundary migration effects due to the initial rapid reduction of dislocation content. (C) 2019 Published by Elsevier Ltd.
URI
https://oasis.postech.ac.kr/handle/2014.oak/100299
DOI
10.1016/j.ijsolstr.2019.06.003
ISSN
0020-7683
Article Type
Article
Citation
INTERNATIONAL JOURNAL OF SOLIDS AND STRUCTURES, vol. 174, page. 38 - 52, 2019-11
Files in This Item:
There are no files associated with this item.

qr_code

  • mendeley

Items in DSpace are protected by copyright, with all rights reserved, unless otherwise indicated.

Related Researcher

Researcher

이병주LEE, BYEONG JOO
Dept of Materials Science & Enginrg
Read more

Views & Downloads

Browse