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Cited 63 time in webofscience Cited 72 time in scopus
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dc.contributor.authorJeon, Hae-Gon-
dc.contributor.authorPark, Jaesik-
dc.contributor.authorChoe, Gyeongmin-
dc.contributor.authorPark, Jinsun-
dc.contributor.authorBok, Yunsu-
dc.contributor.authorTai, Yu-Wing-
dc.contributor.authorKweon, In So-
dc.date.accessioned2019-12-23T08:50:03Z-
dc.date.available2019-12-23T08:50:03Z-
dc.date.created2019-12-04-
dc.date.issued2019-02-
dc.identifier.issn0162-8828-
dc.identifier.urihttps://oasis.postech.ac.kr/handle/2014.oak/100555-
dc.description.abstractOne of the core applications of light field imaging is depth estimation. To acquire a depth map, existing approaches apply a single photo-consistency measure to an entire light field. However, this is not an optimal choice because of the non-uniform light field degradations produced by limitations in the hardware design. In this paper, we introduce a pipeline that automatically determines the best configuration for photo-consistency measure, which leads to the most reliable depth label from the light field. We analyzed the practical factors affecting degradation in lenslet light field cameras, and designed a learning based framework that can retrieve the best cost measure and optimal depth label. To enhance the reliability of our method, we augmented an existing light field benchmark to simulate realistic source dependent noise, aberrations, and vignetting artifacts. The augmented dataset was used for the training and validation of the proposed approach. Our method was competitive with several state-of-the-art methods for the benchmark and real-world light field datasets.-
dc.languageEnglish-
dc.publisherInstitute of Electrical and Electronics Engineers-
dc.relation.isPartOfIEEE Transactions on Pattern Analysis and Machine Intelligence-
dc.titleDepth from a Light Field Image with Learning-based Matching Costs-
dc.typeArticle-
dc.identifier.doi10.1109/TPAMI.2018.2794979-
dc.type.rimsART-
dc.identifier.bibliographicCitationIEEE Transactions on Pattern Analysis and Machine Intelligence, v.41, no.2, pp.297 - 310-
dc.identifier.wosid000456150600003-
dc.citation.endPage310-
dc.citation.number2-
dc.citation.startPage297-
dc.citation.titleIEEE Transactions on Pattern Analysis and Machine Intelligence-
dc.citation.volume41-
dc.contributor.affiliatedAuthorPark, Jaesik-
dc.identifier.scopusid2-s2.0-85040938949-
dc.description.journalClass1-
dc.description.journalClass1-
dc.description.isOpenAccessN-
dc.type.docTypeArticle-
dc.subject.keywordAuthorComputational photography-
dc.subject.keywordAuthorlight field imaging-
dc.subject.keywordAuthordepth estimation-
dc.subject.keywordAuthor3D reconstruction-
dc.subject.keywordAuthoraberration correction-
dc.relation.journalWebOfScienceCategoryComputer Science, Artificial Intelligence-
dc.relation.journalWebOfScienceCategoryEngineering, Electrical & Electronic-
dc.description.journalRegisteredClassscie-
dc.description.journalRegisteredClassscopus-

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