A Control Chart for COM-Poisson Distribution Using Multiple Dependent State Sampling

Abstract

In this article, an attribute control chart has been proposed for the COM-Poisson distributed non-conformities using multiple dependent states sampling based on the exponentially weighted moving average statistic. Average run lengths of the out-of-control process with different shift levels of the COM-Poisson distribution have been calculated through simulation. From comparison, it has been observed that the proposed control chart is better in detecting the out-of-control process quickly as compared with the existing control chart. A simulated example has been given for the practical use of the proposed control chart. Copyright (C) 2016 John Wiley & Sons, Ltd.