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Free-Space Permittivity Measurement for Inhomogeneous PSV-Coated Si-wafer at Frequencies from 75 GHz to 325 GHz
- Title
- Free-Space Permittivity Measurement for Inhomogeneous PSV-Coated Si-wafer at Frequencies from 75 GHz to 325 GHz
- Date Issued
- 2019-05-19
- Publisher
- IEEE
- Article Type
- Conference
- Citation
- 2019 IEEE MTT-S International Wireless Symposium (IWS), 2019-05-19
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Related Researcher
- 홍원빈HONG, WONBIN
- Dept of Electrical Enginrg