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Thickness dependence of carrier mobility in mono- and bi-layer graphene with HfO2 gate dielectric
- Title
- Thickness dependence of carrier mobility in mono- and bi-layer graphene with HfO2 gate dielectric
- Authors
- KIM, SEYOUNG
- Date Issued
- 2010-06-22
- Publisher
- Institute of Electrical and Electronics Engineers
- Article Type
- Conference
- Citation
- 68th Device Research Conference, 2010-06-22
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