Conference
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| DC Field | Value | Language |
|---|---|---|
| dc.contributor.author | KANG, BONG KOO | - |
| dc.contributor.author | Yeohyeok Yun | - |
| dc.contributor.author | Ji-Hoon Seo | - |
| dc.date.accessioned | 2020-04-17T01:51:29Z | - |
| dc.date.available | 2020-04-17T01:51:29Z | - |
| dc.date.created | 2020-04-16 | - |
| dc.date.issued | 2019-11-19 | - |
| dc.identifier.uri | https://oasis.postech.ac.kr/handle/2014.oak/103483 | - |
| dc.publisher | IWDTF 2019 | - |
| dc.relation.isPartOf | IWDTF 2019 | - |
| dc.relation.isPartOf | Proceeding on IWDTF | - |
| dc.title | Analysis of Positive Bias Temperature Instability Degradation in n+ and p+ poly-Si Gates of High-Voltage SiO2 Dielectric nMOSFETs | - |
| dc.type | Conference | - |
| dc.type.rims | CONF | - |
| dc.identifier.bibliographicCitation | IWDTF 2019 | - |
| dc.citation.conferenceDate | 2019-11-18 | - |
| dc.citation.conferencePlace | JA | - |
| dc.citation.title | IWDTF 2019 | - |
| dc.contributor.affiliatedAuthor | KANG, BONG KOO | - |
| dc.contributor.affiliatedAuthor | Yeohyeok Yun | - |
| dc.description.journalClass | 1 | - |
| dc.description.journalClass | 1 | - |
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- 강봉구KANG, BONG KOO
- Dept of Electrical Enginrg