Full metadata record
DC Field | Value | Language |
dc.contributor.author | KANG, BONG KOO | - |
dc.contributor.author | Hyeokjin Kim | - |
dc.contributor.author | Young-Kyu Kown | - |
dc.contributor.author | Giyoun Roh | - |
dc.date.accessioned | 2020-04-17T01:52:23Z | - |
dc.date.available | 2020-04-17T01:52:23Z | - |
dc.date.created | 2020-04-16 | - |
dc.date.issued | 2019-09-24 | - |
dc.identifier.uri | https://oasis.postech.ac.kr/handle/2014.oak/103488 | - |
dc.publisher | ESRF2019 | - |
dc.relation.isPartOf | ESRF2019 | - |
dc.relation.isPartOf | Microelectronics Reliability | - |
dc.title | Channel-length dependence of mechanical stress effect by hybrid shallow trench isolation on NBTI degradation of HfSiON/SiO2 p-channel MOSFETs with strained Si/SiGe channel | - |
dc.type | Conference | - |
dc.type.rims | CONF | - |
dc.identifier.bibliographicCitation | ESRF2019 | - |
dc.citation.conferenceDate | 2019-09-23 | - |
dc.citation.conferencePlace | FR | - |
dc.citation.title | ESRF2019 | - |
dc.contributor.affiliatedAuthor | KANG, BONG KOO | - |
dc.contributor.affiliatedAuthor | Hyeokjin Kim | - |
dc.description.journalClass | 1 | - |
dc.description.journalClass | 1 | - |
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