Conference
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| DC Field | Value | Language |
|---|---|---|
| dc.contributor.author | KANG, BONG KOO | - |
| dc.contributor.author | Giyoun Roh | - |
| dc.contributor.author | Hyeokjin Kim | - |
| dc.date.accessioned | 2020-04-17T01:53:30Z | - |
| dc.date.available | 2020-04-17T01:53:30Z | - |
| dc.date.created | 2020-04-16 | - |
| dc.date.issued | 2019-09-02 | - |
| dc.identifier.uri | https://oasis.postech.ac.kr/handle/2014.oak/103494 | - |
| dc.publisher | SSDM | - |
| dc.relation.isPartOf | 2019 International Conference on Solid State Devices and Materials | - |
| dc.relation.isPartOf | JJAP | - |
| dc.title | Systematic analysis of electron traps of HfSiON/SiO2 nMOSFETs using TSCIS | - |
| dc.type | Conference | - |
| dc.type.rims | CONF | - |
| dc.identifier.bibliographicCitation | 2019 International Conference on Solid State Devices and Materials | - |
| dc.citation.conferenceDate | 2019-09-02 | - |
| dc.citation.conferencePlace | JA | - |
| dc.citation.title | 2019 International Conference on Solid State Devices and Materials | - |
| dc.contributor.affiliatedAuthor | KANG, BONG KOO | - |
| dc.contributor.affiliatedAuthor | Hyeokjin Kim | - |
| dc.description.journalClass | 1 | - |
| dc.description.journalClass | 1 | - |
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Related Researcher
- 강봉구KANG, BONG KOO
- Dept of Electrical Enginrg