STRUCTURAL CHARACTERIZATION OF EPITAXIAL BATIO3 THIN-FILMS GROWN BY SPUTTER-DEPOSITION ON MGO(100)
SCIE
SCOPUS
- Title
- STRUCTURAL CHARACTERIZATION OF EPITAXIAL BATIO3 THIN-FILMS GROWN BY SPUTTER-DEPOSITION ON MGO(100)
- Authors
- KIM, S; HISHITA, S; KANG, YM; BAIK, S
- Date Issued
- 1995-11-01
- Publisher
- AMER INST PHYSICS
- Abstract
- Epitaxial thin films of BaTiO3 have been prepared using radio-frequency magnetron sputter deposition on MgO(100) substrates. Various x-ray-diffraction techniques were employed to characterize the crystal structure of the films. The films were fully tetragonal and consisted of c domains. Their tetragonality has been shown to be 1.013, which is almost the same as the bulk value of BaTiO3. However, the cross-sectional transmission electron microscopic micrograph showed that a very small amount of a domains coexists forming 90 degrees domain boundaries in the matrix of c domains. In spite of the negligible strain caused by the phase transformation, it seems to be inevitable to form a certain small amount of a domains in the BaTiO3 film on MgO system. (C) 1995 American Institute of Physics.
- URI
- https://oasis.postech.ac.kr/handle/2014.oak/10454
- DOI
- 10.1063/1.360696
- ISSN
- 0021-8979
- Article Type
- Article
- Citation
- JOURNAL OF APPLIED PHYSICS, vol. 78, no. 9, page. 5604 - 5608, 1995-11-01
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