Reciprocal space mapping of phase transformation in epitaxial PbTiO3 thin films using synchrotron x-ray diffraction
SCIE
SCOPUS
- Title
- Reciprocal space mapping of phase transformation in epitaxial PbTiO3 thin films using synchrotron x-ray diffraction
- Authors
- Lee, KS; Baik, S
- Date Issued
- 1999-02-01
- Publisher
- AMER INST PHYSICS
- Abstract
- Phase transformation in epitaxial PbTiO3 thin films grown on MgO(001) substrates was studied and quantified by two-dimensional reciprocal space mapping technique using synchrotron x-ray diffraction equipped with an in situ high temperature stage. Just below the Curie temperature, a twin-like domain structure was formed with an initial value of c-domain abundance, alpha similar to 0.3, and the value increased continuously during cooling, and eventually the c-domain dominant structure (alpha similar to 0.72) was achieved at room temperature through continuous expansion of the c domains. By investigating the intensity distribution of contour maps, domain tilting and mosaicity were characterized along the q([h00]) direction and the presence of a strain gradient along the growth direction q([001]) was also confirmed from the asymmetric distribution of the contour maps. (C) 1999 American Institute of Physics. [S0021-8979(99)03403-9].
- URI
- https://oasis.postech.ac.kr/handle/2014.oak/10486
- DOI
- 10.1063/1.369195
- ISSN
- 0021-8979
- Article Type
- Article
- Citation
- JOURNAL OF APPLIED PHYSICS, vol. 85, no. 3, page. 1995 - 1997, 1999-02-01
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