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Top-down nanofabrication approaches toward single-digit-nanometer scale structures SCIE SCOPUS

Title
Top-down nanofabrication approaches toward single-digit-nanometer scale structures
Authors
OH, DONG KYOJEONG, HEONYEONGKIM, JOOHOONYESEUL, KIMKIM, INKIOK, J. G.RHO, JUNSUK
Date Issued
2021-03
Publisher
대한기계학회
Abstract
Sub-10 nm nanostructures have received broad interest for their intriguing nano-optical phenomena, such as extreme field localization and enhancement, quantum tunneling effect, and strong coupling. The range of cutting-edge applications based on single-digit-nanometer scale structures has expanded with the development of nanofabrication technologies. However, challenges still remain in overcoming fabrication limits, such as scalability, controllability, and reproducibility for further practical applications of the sub-10 nm nanostructures. In this review, we discuss the recent advances in top-down nanofabrication methods towards single-digit-nanometer-sized structures. The well-known examples include electron beam lithography (EBL), focused ion beam (FIB) milling or lithography, atomic layer deposition (ALD), and other unconventional techniques to obtain sub-10 nm nanostructures or nanogaps. We discuss state-of-the-art applications for sub-10 nm nanophotonics such as optical trapping or sensing devices, imaging devices, and electronic devices.
URI
https://oasis.postech.ac.kr/handle/2014.oak/105153
DOI
10.1007/s12206-021-0243-7
ISSN
1738-494X
Article Type
Article
Citation
Journal of Mechanical Science and Technology, vol. 35, no. 3, page. 837 - 859, 2021-03
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노준석RHO, JUNSUK
Dept of Mechanical Enginrg
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