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Effects of Trap Charges in Spacer Region on Retention Variation in 3-D NAND Memory Cells

Title
Effects of Trap Charges in Spacer Region on Retention Variation in 3-D NAND Memory Cells
Authors
LEE, JEONG SOOPARK, JOUNG HUNYOON, GILSANGJIN, JAESEOKGO, DONGHYUN
Date Issued
2021-02
Publisher
ICEIC
URI
https://oasis.postech.ac.kr/handle/2014.oak/105307
Article Type
Conference
Citation
2021 International Conference on Electronics, Information, and Communication, 2021-02
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이정수LEE, JEONG SOO
Dept of Electrical Enginrg
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