Conference
Cited 0 time in 
Cited 0 time in 
Cited 0 time in
Metadata Downloads
Novel Trap Profiling in Nitride Layer Using Space Program for 3-D NAND Flash Memory
- Title
- Novel Trap Profiling in Nitride Layer Using Space Program for 3-D NAND Flash Memory
- Date Issued
- 2021-01
- Publisher
- 한국반도체학술대회
- Article Type
- Conference
- Citation
- 제28회 한국반도체학술대회, 2021-01
- Files in This Item:
- There are no files associated with this item.
Items in DSpace are protected by copyright, with all rights reserved, unless otherwise indicated.
Communities & Collection
Related Researcher
- 이정수LEE, JEONG SOO
- Dept of Electrical Enginrg