Open Access System for Information Sharing

Login Library

 

Article
Cited 25 time in webofscience Cited 26 time in scopus
Metadata Downloads
Full metadata record
Files in This Item:
DC FieldValueLanguage
dc.contributor.authorBorse, PH-
dc.contributor.authorYi, JM-
dc.contributor.authorJe, JH-
dc.contributor.authorTsai, WL-
dc.contributor.authorHwu, Y-
dc.date.accessioned2015-06-25T02:13:24Z-
dc.date.available2015-06-25T02:13:24Z-
dc.date.created2009-02-28-
dc.date.issued2004-02-01-
dc.identifier.issn0021-8979-
dc.identifier.other2015-OAK-0000003972en_US
dc.identifier.urihttps://oasis.postech.ac.kr/handle/2014.oak/10549-
dc.description.abstractWe investigated the room temperature electroless nickel deposition on glass, induced by synchrotron x ray. By irradiating electrolytes with intense x ray the onset time for Ni reduction disappears at high electrolyte pH (>6.0) in sharp contrast with conventional electroless deposition. The time for Ni reduction in irradiated solution also decreases with increase in electrolyte pH. Consequently higher reduction rates in alkaline solutions (pH>8.0) raise the Ni nucleation density during deposition, as illustrated by homogeneous and complete coverage of the substrate by nanoparticles within a short period of 1 min. The enhancement in reduction rate is attributed to high redox efficiency of hydrated electrons produced by x ray as well as their redox potential enhancements under higher electrolyte pH conditions. (C) 2004 American Institute of Physics.-
dc.description.statementofresponsibilityopenen_US
dc.languageEnglish-
dc.publisherAMER INST PHYSICS-
dc.relation.isPartOfJOURNAL OF APPLIED PHYSICS-
dc.rightsBY_NC_NDen_US
dc.rights.urihttp://creativecommons.org/licenses/by-nc-nd/2.0/kren_US
dc.titlepH dependence of synchrotron x-ray induced electroless nickel deposition-
dc.typeArticle-
dc.contributor.college신소재공학과en_US
dc.identifier.doi10.1063/1.1637724-
dc.author.googleBorse, PHen_US
dc.author.googleYi, JMen_US
dc.author.googleHwu, Yen_US
dc.author.googleTsai, WLen_US
dc.author.googleJe, JHen_US
dc.relation.volume95en_US
dc.relation.issue3en_US
dc.relation.startpage1166en_US
dc.relation.lastpage1170en_US
dc.contributor.id10123980en_US
dc.relation.journalJOURNAL OF APPLIED PHYSICSen_US
dc.relation.indexSCI급, SCOPUS 등재논문en_US
dc.relation.sciSCIen_US
dc.collections.nameJournal Papersen_US
dc.type.rimsART-
dc.identifier.bibliographicCitationJOURNAL OF APPLIED PHYSICS, v.95, no.3, pp.1166 - 1170-
dc.identifier.wosid000188281800053-
dc.date.tcdate2019-01-01-
dc.citation.endPage1170-
dc.citation.number3-
dc.citation.startPage1166-
dc.citation.titleJOURNAL OF APPLIED PHYSICS-
dc.citation.volume95-
dc.contributor.affiliatedAuthorJe, JH-
dc.identifier.scopusid2-s2.0-1142268131-
dc.description.journalClass1-
dc.description.journalClass1-
dc.description.wostc19-
dc.description.scptc19*
dc.date.scptcdate2018-10-274*
dc.type.docTypeArticle-
dc.relation.journalWebOfScienceCategoryPhysics, Applied-
dc.description.journalRegisteredClassscie-
dc.description.journalRegisteredClassscopus-
dc.relation.journalResearchAreaPhysics-

qr_code

  • mendeley

Items in DSpace are protected by copyright, with all rights reserved, unless otherwise indicated.

Related Researcher

Researcher

제정호JE, JUNG HO
Dept of Materials Science & Enginrg
Read more

Views & Downloads

Browse