Conference
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| DC Field | Value | Language |
|---|---|---|
| dc.contributor.author | LEE, DAESU | - |
| dc.date.accessioned | 2021-06-01T05:19:40Z | - |
| dc.date.available | 2021-06-01T05:19:40Z | - |
| dc.date.created | 2021-02-24 | - |
| dc.date.issued | 2020-11-10 | - |
| dc.identifier.uri | https://oasis.postech.ac.kr/handle/2014.oak/105666 | - |
| dc.publisher | 아태이론물리센터 | - |
| dc.relation.isPartOf | International Workshop on Scanning Probe Microscopy | - |
| dc.title | Colossal flexoresistance effect via atomic force microscope tip pressing | - |
| dc.type | Conference | - |
| dc.type.rims | CONF | - |
| dc.identifier.bibliographicCitation | International Workshop on Scanning Probe Microscopy | - |
| dc.citation.conferenceDate | 2020-11-10 | - |
| dc.citation.conferencePlace | KO | - |
| dc.citation.title | International Workshop on Scanning Probe Microscopy | - |
| dc.contributor.affiliatedAuthor | LEE, DAESU | - |
| dc.description.journalClass | 2 | - |
| dc.description.journalClass | 2 | - |
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