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Interaction of micropipes with foreign polytype inclusions in SiC SCIE SCOPUS

Title
Interaction of micropipes with foreign polytype inclusions in SiC
Authors
Gutkin, MYSheinerman, AGArgunova, TSYi, JMKim, MUJe, JHNagalyuk, SSMokhov, ENMargaritondo, GHwu, Y
Date Issued
2006-11-01
Publisher
AMER INST PHYSICS
Abstract
Synchrotron phase sensitive radiography, optical and scanning electron microscopies, and color photoluminescence have been used to study the interaction of micropipes with foreign polytype inclusions in 4H-SiC bulk crystals grown on 6H-SiC substrates. This combination of techniques confirms that micropipes agglomerate at the polytype inclusions and merge into pores. A mechanism for this phenomenon is suggested based on a three-dimensional theoretical model; the inclusion boundaries elastically interact with micropipes, causing them to migrate from the bulk to their equilibrium positions at the polytype boundaries. The turning of micropipes towards the inclusions is experimentally demonstrated, and the reduction of their density in nearby regions is revealed. Supported by experimental observations, our model helps to understand the pore formation and expansion in SiC bulk crystals. (c) 2006 American Institute of Physics.
URI
https://oasis.postech.ac.kr/handle/2014.oak/10577
DOI
10.1063/1.2359686
ISSN
0021-8979
Article Type
Article
Citation
JOURNAL OF APPLIED PHYSICS, vol. 100, no. 9, 2006-11-01
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제정호JE, JUNG HO
Dept of Materials Science & Enginrg
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