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dc.contributor.authorJang, Jonggyu-
dc.contributor.authorLyu, Hyeonsu-
dc.contributor.authorYang, Hyun Jong-
dc.contributor.authorOh, Moohyun-
dc.contributor.authorLee, Junhee-
dc.date.accessioned2021-06-01T06:08:38Z-
dc.date.available2021-06-01T06:08:38Z-
dc.date.created2021-02-25-
dc.date.issued2020-10-24-
dc.identifier.urihttps://oasis.postech.ac.kr/handle/2014.oak/105832-
dc.publisherIEEE-
dc.relation.isPartOf2020 IEEE/RSJ International Conference on Intelligent Robots and Systems (IROS)-
dc.relation.isPartOf2020 IEEE/RSJ International Conference on Intelligent Robots and Systems (IROS)-
dc.titleDeep Learning-Based Autonomous Scanning Electron Microscope-
dc.typeConference-
dc.type.rimsCONF-
dc.identifier.bibliographicCitation2020 IEEE/RSJ International Conference on Intelligent Robots and Systems (IROS)-
dc.citation.conferenceDate2020-10-24-
dc.citation.conferencePlaceUS-
dc.citation.conferencePlaceLas Vegas, NV, USA-
dc.citation.title2020 IEEE/RSJ International Conference on Intelligent Robots and Systems (IROS)-
dc.contributor.affiliatedAuthorYang, Hyun Jong-
dc.description.journalClass1-
dc.description.journalClass1-

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양현종YANG, HYUN JONG
Dept of Electrical Enginrg
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