Full metadata record
DC Field | Value | Language |
dc.contributor.author | KIM, KWANG JAE | - |
dc.contributor.author | CHOI, SEUNGHYUN | - |
dc.contributor.author | KIM, EUN SOU | - |
dc.contributor.author | BAE, YOUNG MOK | - |
dc.date.accessioned | 2021-06-01T06:10:06Z | - |
dc.date.available | 2021-06-01T06:10:06Z | - |
dc.date.created | 2021-03-05 | - |
dc.date.issued | 2020-10-23 | - |
dc.identifier.uri | https://oasis.postech.ac.kr/handle/2014.oak/105841 | - |
dc.publisher | 2021 Fall Conference of Korean Society of Quality Management | - |
dc.relation.isPartOf | 2021 Fall Conference of Korean Society of Quality Management | - |
dc.title | 공간 차원 기반의 wafer bin map 불량 패턴 분류체계 개발 | - |
dc.type | Conference | - |
dc.type.rims | CONF | - |
dc.identifier.bibliographicCitation | 2021 Fall Conference of Korean Society of Quality Management | - |
dc.citation.conferenceDate | 2020-10-23 | - |
dc.citation.conferencePlace | KO | - |
dc.citation.title | 2021 Fall Conference of Korean Society of Quality Management | - |
dc.contributor.affiliatedAuthor | KIM, KWANG JAE | - |
dc.contributor.affiliatedAuthor | CHOI, SEUNGHYUN | - |
dc.contributor.affiliatedAuthor | BAE, YOUNG MOK | - |
dc.description.journalClass | 2 | - |
dc.description.journalClass | 2 | - |
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