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Cited 20 time in webofscience Cited 18 time in scopus
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dc.contributor.authorSon, J-
dc.contributor.authorCagnon, J-
dc.contributor.authorStemmer, S-
dc.date.accessioned2015-06-25T02:15:15Z-
dc.date.available2015-06-25T02:15:15Z-
dc.date.created2013-05-01-
dc.date.issued2009-08-15-
dc.identifier.issn0021-8979-
dc.identifier.other2015-OAK-0000027541en_US
dc.identifier.urihttps://oasis.postech.ac.kr/handle/2014.oak/10609-
dc.description.abstractThe relationship between strain relaxation and microstructure evolution of epitaxial, (001)-oriented Pt thin films on (001) SrTiO3 substrates is investigated as a function of Pt film thickness. X-ray diffraction shows that the Pt films gradually relax after film coalescence with increasing film thickness. The Pt film surfaces exhibit a cross-hatched surface pattern that increases in amplitude and density with film thickness and is due to progressive relaxation of the lattice mismatch strain by twinning. The potential of these Pt films as bottom electrodes for functional perovskite films is discussed. (C) 2009 American Institute of Physics. [DOI: 10.1063/1.3207795]-
dc.description.statementofresponsibilityopenen_US
dc.languageEnglish-
dc.publisherAmerican institute of physics-
dc.relation.isPartOfJournal of Applied Physics-
dc.rightsBY_NC_NDen_US
dc.rights.urihttp://creativecommons.org/licenses/by-nc-nd/2.0/kren_US
dc.titleStrain relaxation in epitaxial Pt films on (001) SrTiO3-
dc.typeArticle-
dc.contributor.college신소재공학과en_US
dc.identifier.doi10.1063/1.3207795-
dc.author.googleSon, Jen_US
dc.author.googleCagnon, Jen_US
dc.author.googleStemmer, Sen_US
dc.relation.volume106en_US
dc.relation.issue4en_US
dc.contributor.id10138992en_US
dc.relation.journalJournal of Applied Physicsen_US
dc.relation.indexSCI급, SCOPUS 등재논문en_US
dc.relation.sciSCIen_US
dc.collections.nameJournal Papersen_US
dc.type.rimsART-
dc.identifier.bibliographicCitationJournal of Applied Physics, v.106, no.4-
dc.identifier.wosid000270083800040-
dc.date.tcdate2019-01-01-
dc.citation.number4-
dc.citation.titleJournal of Applied Physics-
dc.citation.volume106-
dc.contributor.affiliatedAuthorSon, J-
dc.identifier.scopusid2-s2.0-69749114106-
dc.description.journalClass1-
dc.description.journalClass1-
dc.description.wostc15-
dc.description.scptc15*
dc.date.scptcdate2018-10-274*
dc.type.docTypeArticle-
dc.subject.keywordPlusTEMPERATURE-DEPENDENCE-
dc.subject.keywordPlusSURFACE-MORPHOLOGY-
dc.subject.keywordPlusTHIN-
dc.subject.keywordPlusGROWTH-
dc.subject.keywordPlusORIENTATION-
dc.subject.keywordPlusPLATINUM-
dc.relation.journalWebOfScienceCategoryPhysics, Applied-
dc.description.journalRegisteredClassscie-
dc.description.journalRegisteredClassscopus-
dc.relation.journalResearchAreaPhysics-

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손준우SON, JUNWOO
Dept of Materials Science & Enginrg
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