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dc.contributor.authorBAEK, CHANG KI-
dc.contributor.authorKwak, HYEON-TAK-
dc.contributor.authorCHO, HYEONSU-
dc.date.accessioned2021-06-01T10:54:35Z-
dc.date.available2021-06-01T10:54:35Z-
dc.date.created2021-01-20-
dc.date.issued2020-02-14-
dc.identifier.urihttps://oasis.postech.ac.kr/handle/2014.oak/106309-
dc.description.abstractPolycrystalline (poly) lanthanum fluoride (LaF 3 ) Electrolyte Insulator Semiconductor (EIS) sensors can serve as a promising portable sensor platform for monitoring fluoride ion (F −−) concentration due to small size, fast response and simple fabrication method. The key successful implementation is to consider and understand the effects of measurement environments on the F detection. Here, we propose a pathway for accurate F analysi s in tap water by using low concentration of buffer solution. The F sensing characteristics of poly LaF 3 EIS sensors are extensively investigated by varying the concentration of total ionic strength adjustment buffer solution (TISAB). The sensors exhibit a high sensitivity ( S pF ) of 50.3 mV/pF, a low limit of detection (LOD) of 1.4 ppb in the 100 times diluted TISAB (0.01×TISAB). In addition, the poly LaF 3 EIS sensor shows a good selective detection of F over other ions. When F analysis of tap water is compared to a commercial F ion selective electrode, the results is only different by 6.1 % for the 0.01×TISAB compared to 11.2 % for 1×TISAB. Thus, the dilution of TISAB can provide better measurement condition for highly accurate F analysis in actual sens or applications.-
dc.languageKorean-
dc.publisher한국반도체산업협회-
dc.relation.isPartOfThe 27th Korean Conference on Semiconductors (KCS 2020)-
dc.relation.isPartOfThe 27th Korean Conference on Semiconductors (KCS 2020)-
dc.titleHighly Accurate Fluoride ion Detection in Tap Water with Diluted Buffer Solution-
dc.typeConference-
dc.type.rimsCONF-
dc.identifier.bibliographicCitationThe 27th Korean Conference on Semiconductors (KCS 2020)-
dc.citation.conferenceDate2020-02-12-
dc.citation.conferencePlaceKO-
dc.citation.conferencePlace하이원리조트-
dc.citation.titleThe 27th Korean Conference on Semiconductors (KCS 2020)-
dc.contributor.affiliatedAuthorBAEK, CHANG KI-
dc.contributor.affiliatedAuthorKwak, HYEON-TAK-
dc.contributor.affiliatedAuthorCHO, HYEONSU-
dc.description.journalClass2-
dc.description.journalClass2-

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