DC Field | Value | Language |
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dc.contributor.author | BAEK, CHANG KI | - |
dc.contributor.author | Kwak, HYEON-TAK | - |
dc.contributor.author | CHO, HYEONSU | - |
dc.date.accessioned | 2021-06-01T10:54:35Z | - |
dc.date.available | 2021-06-01T10:54:35Z | - |
dc.date.created | 2021-01-20 | - |
dc.date.issued | 2020-02-14 | - |
dc.identifier.uri | https://oasis.postech.ac.kr/handle/2014.oak/106309 | - |
dc.description.abstract | Polycrystalline (poly) lanthanum fluoride (LaF 3 ) Electrolyte Insulator Semiconductor (EIS) sensors can serve as a promising portable sensor platform for monitoring fluoride ion (F −−) concentration due to small size, fast response and simple fabrication method. The key successful implementation is to consider and understand the effects of measurement environments on the F detection. Here, we propose a pathway for accurate F analysi s in tap water by using low concentration of buffer solution. The F sensing characteristics of poly LaF 3 EIS sensors are extensively investigated by varying the concentration of total ionic strength adjustment buffer solution (TISAB). The sensors exhibit a high sensitivity ( S pF ) of 50.3 mV/pF, a low limit of detection (LOD) of 1.4 ppb in the 100 times diluted TISAB (0.01×TISAB). In addition, the poly LaF 3 EIS sensor shows a good selective detection of F over other ions. When F analysis of tap water is compared to a commercial F ion selective electrode, the results is only different by 6.1 % for the 0.01×TISAB compared to 11.2 % for 1×TISAB. Thus, the dilution of TISAB can provide better measurement condition for highly accurate F analysis in actual sens or applications. | - |
dc.language | Korean | - |
dc.publisher | 한국반도체산업협회 | - |
dc.relation.isPartOf | The 27th Korean Conference on Semiconductors (KCS 2020) | - |
dc.relation.isPartOf | The 27th Korean Conference on Semiconductors (KCS 2020) | - |
dc.title | Highly Accurate Fluoride ion Detection in Tap Water with Diluted Buffer Solution | - |
dc.type | Conference | - |
dc.type.rims | CONF | - |
dc.identifier.bibliographicCitation | The 27th Korean Conference on Semiconductors (KCS 2020) | - |
dc.citation.conferenceDate | 2020-02-12 | - |
dc.citation.conferencePlace | KO | - |
dc.citation.conferencePlace | 하이원리조트 | - |
dc.citation.title | The 27th Korean Conference on Semiconductors (KCS 2020) | - |
dc.contributor.affiliatedAuthor | BAEK, CHANG KI | - |
dc.contributor.affiliatedAuthor | Kwak, HYEON-TAK | - |
dc.contributor.affiliatedAuthor | CHO, HYEONSU | - |
dc.description.journalClass | 2 | - |
dc.description.journalClass | 2 | - |
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