Conference
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| DC Field | Value | Language |
|---|---|---|
| dc.contributor.author | LEE, JEONG SOO | - |
| dc.contributor.author | JO, YONG JIN | - |
| dc.contributor.author | OH, HYEON GWAN | - |
| dc.contributor.author | YOON, GILSANG | - |
| dc.contributor.author | JIN, JAESEOK | - |
| dc.contributor.author | GO, DONGHYUN | - |
| dc.contributor.author | PARK, JOUNG HUN | - |
| dc.date.accessioned | 2021-06-01T10:56:14Z | - |
| dc.date.available | 2021-06-01T10:56:14Z | - |
| dc.date.created | 2021-03-11 | - |
| dc.date.issued | 2020-02 | - |
| dc.identifier.uri | https://oasis.postech.ac.kr/handle/2014.oak/106320 | - |
| dc.language | Korean | - |
| dc.publisher | 한국반도체학술대회 | - |
| dc.relation.isPartOf | 제27회 한국반도체학술대회 | - |
| dc.title | Effect of Interface Roughness on Program/Erase Efficiency for 3D Vertical NAND Flash Memory applications | - |
| dc.type | Conference | - |
| dc.type.rims | CONF | - |
| dc.identifier.bibliographicCitation | 제27회 한국반도체학술대회 | - |
| dc.citation.conferenceDate | 2020-02-12 | - |
| dc.citation.conferencePlace | KO | - |
| dc.citation.conferencePlace | 강원도 하이원리조트 | - |
| dc.citation.title | 제27회 한국반도체학술대회 | - |
| dc.contributor.affiliatedAuthor | LEE, JEONG SOO | - |
| dc.contributor.affiliatedAuthor | JO, YONG JIN | - |
| dc.contributor.affiliatedAuthor | OH, HYEON GWAN | - |
| dc.contributor.affiliatedAuthor | YOON, GILSANG | - |
| dc.contributor.affiliatedAuthor | JIN, JAESEOK | - |
| dc.contributor.affiliatedAuthor | GO, DONGHYUN | - |
| dc.contributor.affiliatedAuthor | PARK, JOUNG HUN | - |
| dc.description.journalClass | 2 | - |
| dc.description.journalClass | 2 | - |
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Related Researcher
- 이정수LEE, JEONG SOO
- Dept of Electrical Enginrg