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dc.contributor.authorKim, DH-
dc.contributor.authorHwang, JH-
dc.contributor.authorLee, KH-
dc.contributor.authorKang, JS-
dc.contributor.authorNozaki, T-
dc.contributor.authorHayashi, K-
dc.contributor.authorKajitani, T-
dc.contributor.authorPark, BG-
dc.contributor.authorKim, JY-
dc.contributor.authorMin, BI-
dc.date.accessioned2015-06-25T02:16:11Z-
dc.date.available2015-06-25T02:16:11Z-
dc.date.created2012-03-17-
dc.date.issued2011-04-01-
dc.identifier.issn0021-8979-
dc.identifier.other2015-OAK-0000024883en_US
dc.identifier.urihttps://oasis.postech.ac.kr/handle/2014.oak/10639-
dc.description.abstractElectronic structures of Ni-doped CuFe1-xNixO2 delafossite oxides (x = 0, 0.015, and 0.03) have been investigated by employing soft x-ray absorption spectroscopy and soft x-ray magnetic circular dichroism (XMCD). It is found that the valence states of Cu, Fe, and Ni ions are nearly monovalent (Cu+), trivalent (Fe3(+)), and divalent (Ni2+), respectively, and that they do not change with x. In contrast, the Cu 2p XMCD signals, which arise from the Cu2+ states, increase with increasing x. This study suggests that the increasing XMCD signals are presumably related to the formation of ferrimagnetic spinel impurities in CuFe1-xNixO2. (c) 2011 American Institute of Physics. [doi: 10.1063/1.3561041]-
dc.description.statementofresponsibilityopenen_US
dc.languageEnglish-
dc.publisherAIP-
dc.relation.isPartOfJOURNAL OF APPLIED PHYSICS-
dc.rightsBY_NC_NDen_US
dc.rights.urihttp://creativecommons.org/licenses/by-nc-nd/2.0/kren_US
dc.titleSoft x-ray synchrotron radiation spectroscopy study of CuFe(1-x)Ni(x)O(2) (0 <= x <= 0.03) delafossite oxides-
dc.typeArticle-
dc.contributor.college물리학과en_US
dc.identifier.doi10.1063/1.3561041-
dc.author.googleKim, DHen_US
dc.author.googleHwang, JHen_US
dc.author.googleMin, BIen_US
dc.author.googleKim, JYen_US
dc.author.googlePark, BGen_US
dc.author.googleKajitani, Ten_US
dc.author.googleHayashi, Ken_US
dc.author.googleNozaki, Ten_US
dc.author.googleKang, JSen_US
dc.author.googleLee, KHen_US
dc.relation.volume109en_US
dc.relation.issue7en_US
dc.relation.startpage07D727en_US
dc.contributor.id10069852en_US
dc.relation.journalJOURNAL OF APPLIED PHYSICSen_US
dc.relation.indexSCI급, SCOPUS 등재논문en_US
dc.relation.sciSCIen_US
dc.collections.nameJournal Papersen_US
dc.type.rimsART-
dc.identifier.bibliographicCitationJOURNAL OF APPLIED PHYSICS, v.109, no.7, pp.7D727-
dc.identifier.wosid000289952100258-
dc.date.tcdate2019-01-01-
dc.citation.number7-
dc.citation.startPage7D727-
dc.citation.titleJOURNAL OF APPLIED PHYSICS-
dc.citation.volume109-
dc.contributor.affiliatedAuthorMin, BI-
dc.identifier.scopusid2-s2.0-79955405130-
dc.description.journalClass1-
dc.description.journalClass1-
dc.description.wostc3-
dc.description.scptc3*
dc.date.scptcdate2018-10-274*
dc.type.docTypeArticle-
dc.subject.keywordPlusTRANSITION-METAL COMPOUNDS-
dc.subject.keywordPlusELECTRONIC-STRUCTURE-
dc.subject.keywordPlusABSORPTION-SPECTROSCOPY-
dc.subject.keywordPlusTHERMOELECTRIC PROPERTIES-
dc.subject.keywordPlusCIRCULAR-DICHROISM-
dc.subject.keywordPlusPHOTOEMISSION-
dc.subject.keywordPlusSPECTRA-
dc.relation.journalWebOfScienceCategoryPhysics, Applied-
dc.description.journalRegisteredClassscie-
dc.description.journalRegisteredClassscopus-
dc.relation.journalResearchAreaPhysics-

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