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| DC Field | Value | Language |
|---|---|---|
| dc.contributor.author | Kim, Huisoo | - |
| dc.contributor.author | Oh, Moohyun | - |
| dc.contributor.author | Lee, Heerang | - |
| dc.contributor.author | Jang, Jonggyu | - |
| dc.contributor.author | Kim, Myeung Un | - |
| dc.contributor.author | Yang, Hyun Jong | - |
| dc.contributor.author | Ryoo, Michael | - |
| dc.contributor.author | Lee, Junhee | - |
| dc.date.accessioned | 2021-06-01T11:58:29Z | - |
| dc.date.available | 2021-06-01T11:58:29Z | - |
| dc.date.created | 2021-02-25 | - |
| dc.date.issued | 2019-08 | - |
| dc.identifier.uri | https://oasis.postech.ac.kr/handle/2014.oak/106416 | - |
| dc.publisher | Cambridge University Press (CUP) | - |
| dc.relation.isPartOf | Microscopy and Microanalysis | - |
| dc.relation.isPartOf | Microscopy and Microanalysis | - |
| dc.title | Deep-Learning Based Autofocus Score Prediction of Scanning Electron Microscope | - |
| dc.type | Conference | - |
| dc.type.rims | CONF | - |
| dc.identifier.bibliographicCitation | Microscopy and Microanalysis, pp.182 - 183 | - |
| dc.citation.conferenceDate | 2019-08-05 | - |
| dc.citation.conferencePlace | UK | - |
| dc.citation.endPage | 183 | - |
| dc.citation.startPage | 182 | - |
| dc.citation.title | Microscopy and Microanalysis | - |
| dc.contributor.affiliatedAuthor | Yang, Hyun Jong | - |
| dc.description.journalClass | 1 | - |
| dc.description.journalClass | 1 | - |
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- 양현종YANG, HYUN JONG
- Dept of Electrical Enginrg