Giant Flexoelectric Effect in Ferroelectric Epitaxial Thin Films
SCIE
- Title
- Giant Flexoelectric Effect in Ferroelectric Epitaxial Thin Films
- Authors
- Lee, D; Yoon, A; Jang, SY; Yoon, JG; Chung, JS; Kim, M; Scott, JF; Noh, TW
- Date Issued
- 2011-07-29
- Publisher
- AMER PHYSICAL SOC
- Abstract
- We report on nanoscale strain gradients in ferroelectric HoMnO3 epitaxial thin films, resulting in a giant flexoelectric effect. Using grazing-incidence in-plane x-ray diffraction, we measured strain gradients in the films, which were 6 or 7 orders of magnitude larger than typical values reported for bulk oxides. The combination of transmission electron microscopy, electrical measurements, and electrostatic calculations showed that flexoelectricity provides a means of tuning the physical properties of ferroelectric epitaxial thin films, such as domain configurations and hysteresis curves.
- URI
- https://oasis.postech.ac.kr/handle/2014.oak/107064
- DOI
- 10.1103/PhysRevLett.107.057602
- ISSN
- 0031-9007
- Article Type
- Article
- Citation
- PHYSICAL REVIEW LETTERS, vol. 107, no. 5, 2011-07-29
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- There are no files associated with this item.
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