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Cited 12 time in webofscience Cited 14 time in scopus
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Chatter Detection and Diagnosis in Hot Strip Mill Process With a Frequency-Based Chatter Index and Modified Independent Component Analysis SCIE SCOPUS

Title
Chatter Detection and Diagnosis in Hot Strip Mill Process With a Frequency-Based Chatter Index and Modified Independent Component Analysis
Authors
JO, Ha-NuiPARK, BYEONG EONJI, YUMIKIM, Dong-KukYANG, Jeong EunLEE, IN BEUM
Date Issued
2020-12
Publisher
IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC
Abstract
In this article, we propose a framework to monitor the chatter phenomenon and to diagnose the cause variables of chatter occurred in the hot strip mill process (HSMP). For monitoring chatter, we develop a chatter index (CI) that quantifies chatter to confirm its occurrence. Based on the data classified as normal by the CI, a multivariate statistical process monitoring model for detecting chatter is constructed using the modified independent component analysis (MICA) method. The monitoring results show that the model based on the MICA outperforms other models based on the principal component analysis and independent component analysis. For the diagnosis of the cause variables of detected chatter, various contribution plots can be used. In this article, we develop a relative contribution plot for a more obvious diagnosis than the existing contribution plot. Using this, we diagnose and analyze the cause variables of the detected chatter in the HSMP.
Keywords
FAULT-DETECTION
URI
https://oasis.postech.ac.kr/handle/2014.oak/107813
DOI
10.1109/TII.2020.2978526
ISSN
1551-3203
Article Type
Article
Citation
IEEE TRANSACTIONS ON INDUSTRIAL INFORMATICS, vol. 16, no. 12, page. 7812 - 7820, 2020-12
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이인범LEE, IN BEUM
Dept. of Chemical Enginrg
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