DC Field | Value | Language |
---|---|---|
dc.contributor.author | SONG, CHANGYONG | - |
dc.contributor.author | JUNG, CHEOL HO | - |
dc.contributor.author | JUNHA, HWANG | - |
dc.contributor.author | NAM, DAEWOONG | - |
dc.contributor.author | SUNG, DAEHO | - |
dc.contributor.author | DOHYUNG, CHO | - |
dc.contributor.author | HEEMIN, LEE | - |
dc.contributor.author | KIM, SANGSOO | - |
dc.contributor.author | Tono, Kensuke | - |
dc.contributor.author | Yabashi, Makina | - |
dc.contributor.author | Ishikawa, Tetsuya | - |
dc.contributor.author | Noh, Do Young | - |
dc.date.accessioned | 2021-12-03T09:25:07Z | - |
dc.date.available | 2021-12-03T09:25:07Z | - |
dc.date.created | 2020-06-24 | - |
dc.date.issued | 2020-06 | - |
dc.identifier.issn | 2331-7019 | - |
dc.identifier.uri | https://oasis.postech.ac.kr/handle/2014.oak/107884 | - |
dc.description.abstract | Interest in atomic scale structures of individual specimens has invigorated developments of high-resolution probes, which include single-particle imaging using x-ray free-electron lasers (XFELs). The demonstrated spatial resolution, however, remains at tens of nanometers with difficulty in collecting diffraction signals at high frequency distinguished from noises. As such, various resolution-enhancement methods have been introduced, but few experimental verifications are available. Here, by carrying out XFEL single-pulse diffraction experiments, we explicitly unveil the dependence of SNRs on incident xray flux, data averaging, or multiparticle interference. We further propose a data-accumulation method of resolution-shell averaging as a robust scheme to improve the SNR. This study establishes a roadmap with which high-resolution XFEL single-pulse experiments can be contrived. | - |
dc.language | English | - |
dc.publisher | American Physical Society | - |
dc.relation.isPartOf | Physical Review Applied | - |
dc.title | Structure investigation of single specimens with femtosecond X-ray laser: Routes to signal-to-noise ratio enhancements | - |
dc.type | Article | - |
dc.identifier.doi | 10.1103/PhysRevApplied.13.064045 | - |
dc.type.rims | ART | - |
dc.identifier.bibliographicCitation | Physical Review Applied, v.13, no.6, pp.064045 | - |
dc.identifier.wosid | 000540915800002 | - |
dc.citation.number | 6 | - |
dc.citation.startPage | 064045 | - |
dc.citation.title | Physical Review Applied | - |
dc.citation.volume | 13 | - |
dc.contributor.affiliatedAuthor | SONG, CHANGYONG | - |
dc.contributor.affiliatedAuthor | JUNG, CHEOL HO | - |
dc.contributor.affiliatedAuthor | JUNHA, HWANG | - |
dc.contributor.affiliatedAuthor | NAM, DAEWOONG | - |
dc.contributor.affiliatedAuthor | SUNG, DAEHO | - |
dc.contributor.affiliatedAuthor | DOHYUNG, CHO | - |
dc.contributor.affiliatedAuthor | HEEMIN, LEE | - |
dc.contributor.affiliatedAuthor | KIM, SANGSOO | - |
dc.identifier.scopusid | 2-s2.0-85087588011 | - |
dc.description.journalClass | 1 | - |
dc.description.journalClass | 1 | - |
dc.description.isOpenAccess | N | - |
dc.type.docType | ARTICLE | - |
dc.subject.keywordPlus | FREE-ELECTRON LASER | - |
dc.subject.keywordPlus | RESOLUTION | - |
dc.relation.journalWebOfScienceCategory | Physics, Applied | - |
dc.description.journalRegisteredClass | scie | - |
dc.description.journalRegisteredClass | scopus | - |
dc.relation.journalResearchArea | Physics | - |
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