Accurate Method for Estimating of the Charge in the Bunching Part of an Electron Beam by Using an Electro-Optic Crystal

Abstract

Electro-optic sampling (EOS) is a promising method to measure various properties of an electron beam non-destructively. An analysis procedure for electro-optic (EO) measurements to estimate the charge in the bunching part of an electron beam whose shape is not Gaussian is introduced in this paper. Experimental results measured by using the EO method are analyzed in terms of the relative phase shift between the horizontal and the vertical components of the laser. A simulation study is done with the pulse propagation method, which utilizes the Fourier transform to investigate the evolution of an electromagnetic pulse inside the EO crystal. The analysis result of the EO measurement expressed in terms of the relative phase shift is compared with the simulation and it shows a good agreement with the beam charge. The charge in the bunching part of the electron beam can be estimated accurately by using the analysis procedure in this paper.