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A study of detection schemes in electro-optic sampling technique SCIE SCOPUS
- Title
- A study of detection schemes in electro-optic sampling technique
- Date Issued
- 2008-03-01
- Publisher
- ELSEVIER SCIENCE BV
- Abstract
- Electro-optic sampling (EOS) is a powerful tool for the measurement of the electron beam or THz radiation. A new detection scheme called "near crossed polarizer (NCP)" scheme in the EOS technique is developed to increase the signal-to-noise ratio (SNR) in the experiment. The new detection scheme is studied in detail and the 3D scanning result with electron beam in FLASH is compared with the theoretical result of the detection scheme. (C) 2007 Elsevier B.V. All rights reserved.
- Keywords
- electro-optic; electron beam
- ISSN
- 0168-9002
- Article Type
- Article
- Citation
- NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION A-ACCELERATORS SPECTROMETERS DETECTORS AND ASSOCIATED EQUIPMENT, vol. 586, no. 3, page. 452 - 457, 2008-03-01
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Related Researcher
- 고인수KO, IN SOO
- Dept of Physics