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Characterization of XFEL single pulses using single particle imaging: application to PAL-XFEL
- Title
- Characterization of XFEL single pulses using single particle imaging: application to PAL-XFEL
- Authors
- LEE, HEEMIN; DOHYUNG, CHO; NAM, DAEWOONG; KIM, SANGSOO; KOO, TAE YEONG; NOH, DO YOUNG; SONG, CHANGYONG
- Date Issued
- 2018-03-06
- Publisher
- American Physical Society
- Article Type
- Conference
- Citation
- APS March Meeting 2018, 2018-03-06
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