Conference
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| DC Field | Value | Language |
|---|---|---|
| dc.contributor.author | IL, JOO JEONG | - |
| dc.contributor.author | 이무엽 | - |
| dc.contributor.author | LEE, SEUNGCHUL | - |
| dc.date.accessioned | 2022-02-10T01:20:14Z | - |
| dc.date.available | 2022-02-10T01:20:14Z | - |
| dc.date.created | 2022-02-09 | - |
| dc.date.issued | 2021-11-24 | - |
| dc.identifier.uri | https://oasis.postech.ac.kr/handle/2014.oak/109274 | - |
| dc.publisher | 한국소음진동공학회 | - |
| dc.relation.isPartOf | 한국소음진동공학회 2021년도 추계학술대회 | - |
| dc.relation.isPartOf | 한국소음진동공학회 2021년도 추계학술대회 | - |
| dc.title | Wafer Failure Map Retrieval using Multiple Global Descriptors | - |
| dc.type | Conference | - |
| dc.type.rims | CONF | - |
| dc.identifier.bibliographicCitation | 한국소음진동공학회 2021년도 추계학술대회 | - |
| dc.citation.conferenceDate | 2021-11-24 | - |
| dc.citation.conferencePlace | KO | - |
| dc.citation.title | 한국소음진동공학회 2021년도 추계학술대회 | - |
| dc.contributor.affiliatedAuthor | IL, JOO JEONG | - |
| dc.contributor.affiliatedAuthor | LEE, SEUNGCHUL | - |
| dc.description.journalClass | 2 | - |
| dc.description.journalClass | 2 | - |
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Related Researcher
- 이승철LEE, SEUNGCHUL
- Dept of Mechanical Enginrg