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Analysis of VT Gain and Related Lateral Migration Using Pro-gram-Erase-Program Pattern in 3-D NAND Flash Memory
- Title
- Analysis of VT Gain and Related Lateral Migration Using Pro-gram-Erase-Program Pattern in 3-D NAND Flash Memory
- Date Issued
- 2021-09-07
- Publisher
- The Japan Society of Applied Physics
- Article Type
- Conference
- Citation
- 2021 International Conference on Solid State Devices and Materials, 2021-09-07
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Related Researcher
- 이정수LEE, JEONG SOO
- Dept of Electrical Enginrg