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(Ta/Si) multilayer as a wide-bandpass monochromator material SCIE SCOPUS
- Title
- (Ta/Si) multilayer as a wide-bandpass monochromator material
- Date Issued
- 1998-05-01
- Publisher
- MUNKSGAARD INT PUBL LTD
- Abstract
- Specular and non-specular X-ray reflectivity intensities of a (Ta/Si)(60) multilayer sample were measured to characterize its interface structure. Since the multilayer has a good reflectance at its multilayer peaks, its performance as a wide-bandpass monochromator for X-ray scattering experiments of polymers has been tested.
- ISSN
- 0909-0495
- Article Type
- Article
- Citation
- JOURNAL OF SYNCHROTRON RADIATION, vol. 5, page. 705 - 707, 1998-05-01
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Related Researcher
- 이기봉LEE, KI BONG
- Div. of Advanced Nuclear Enginrg