Linear combination of XANES for quantitative analysis of Ti-Si binary oxides
SCIE
SCOPUS
- Title
- Linear combination of XANES for quantitative analysis of Ti-Si binary oxides
- Authors
- Lee, JS; Kim, WB; Choi, SH
- Date Issued
- 2001-03
- Publisher
- MUNKSGAARD INT PUBL LTD
- Abstract
- A new method is demonstrated for the quantification of Ti-O-Si and Ti-O-Ti bonds in Ti-Si binary oxides. It is based on the linear combination of two reference X-ray absorption near-edge structure (XANES) spectra at the Ti K edge. The proper selection of a Ti-O-Si reference material is most important for the successful application of this method. Three Ti-Si binary oxide systems have been analysed by the new method: Ti-Si mixed oxides, titania supported on silica and Ti-substituted MCM-41 (crystalline mesoporous molecular sieve material invented by Mobil) with various Ti contents.
- URI
- https://oasis.postech.ac.kr/handle/2014.oak/11033
- DOI
- 10.1107/S0909049500020331
- ISSN
- 0909-0495
- Article Type
- Article
- Citation
- JOURNAL OF SYNCHROTRON RADIATION, vol. 8, page. 163 - 167, 2001-03
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