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dc.contributor.author신범조-
dc.date.accessioned2022-03-29T03:14:30Z-
dc.date.available2022-03-29T03:14:30Z-
dc.date.issued2021-
dc.identifier.otherOAK-2015-08696-
dc.identifier.urihttp://postech.dcollection.net/common/orgView/200000366650ko_KR
dc.identifier.urihttps://oasis.postech.ac.kr/handle/2014.oak/111501-
dc.descriptionMaster-
dc.description.abstractMultiple Instance Learning (MIL) involves predicting a single binary label for a bag of instances, given positive or negative labels at bag-level. Since a positive bag contains both positive and negative instances, it is often required to detect positive instances (key instances) when a set of instances is categorized as a positive bag. The attention-based deep MIL model is a recent advance in both bag-level classification and key instance detection (KID). However, if the positive and negative instances in a positive bag are not clearly distinguishable, the attention-based deep MIL model has limited KID performance as the attention scores are skewed to few positive instances. In this paper, we present a method to improve the attention-based deep MIL model in the task of KID. The main idea is to use the neural network inversion to find which instances made contribution to the bag-level prediction produced by the trained MIL model. Moreover, we apply L2 constraint in terms of data into the neural network inversion. Numerical experiments on an MNIST-based image MIL dataset and two real-world histopathology datasets verify the validity of our method, demonstrating the KID performance is significantly improved while the performance of bag-level prediction is maintained.-
dc.languageeng-
dc.publisher포항공과대학교-
dc.titleNeural Network Inversion For Key Instance Detection In Multiple Instance Learning-
dc.title.alternative다중 인스턴스 학습에서 키 인스턴스 검출을 위한 뉴럴 네트워크 인버전-
dc.typeThesis-
dc.contributor.college일반대학원 컴퓨터공학과-
dc.date.degree2021- 2-

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