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Cited 15 time in webofscience Cited 15 time in scopus
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dc.contributor.authorYun, DJ-
dc.contributor.authorRhee, SW-
dc.date.accessioned2015-06-25T02:32:37Z-
dc.date.available2015-06-25T02:32:37Z-
dc.date.created2009-03-16-
dc.date.issued2008-01-
dc.identifier.issn0013-4651-
dc.identifier.other2015-OAK-0000010935en_US
dc.identifier.urihttps://oasis.postech.ac.kr/handle/2014.oak/11164-
dc.description.abstractThe formation of a self-assembled monolayer (SAM) with octadecyltrichlorosilane (OTS) and phenetyltrichlorosilane (PTS) on a molybdenum (Mo) surface and surface properties like surface energy, work function, and roughness were studied. From X-ray photoelectron spectroscopy (XPS) measurement, the native oxide of Mo was confirmed and this could react with trichlorosilane to form a SAM. The formation of OTS and PTS monolayers was confirmed and investigated using contact angle measurement, Fourier transform infrared spectroscopy (FTIR), atomic force microscopy, and XPS. After formation of the SAM, Si-O bond formation was observed with a decreased intensity of the Mo-O bond with XPS. The effect of dipping time for the formation of SAM was monitored with FTIR peak intensity of OTS and PTS and also the change in surface energy. It was confirmed that in the SAM formation with OTS, the hydrophilic surface was transformed into a hydrophobic state, roughness was reduced, and the work function was increased about 0.1 eV. Pentacene thin film deposited on SAM-treated Mo gave a better crystallinity and the contact resistance of Mo-pentacene was reduced. (c) 2008 The Electrochemical Society.-
dc.description.statementofresponsibilityopenen_US
dc.languageEnglish-
dc.publisherELECTROCHEMICAL SOC INC-
dc.relation.isPartOfJOURNAL OF THE ELECTROCHEMICAL SOCIETY-
dc.rightsBY_NC_NDen_US
dc.rights.urihttp://creativecommons.org/licenses/by-nc-nd/2.0/kren_US
dc.titleSelf-assembled monolayer formation on molybdenum with octadecyltrichlorosilane and phenethyltrichlorosilane and measurement of molybdenum-pentacene interface properties-
dc.typeArticle-
dc.contributor.college화학공학과en_US
dc.identifier.doi10.1149/1.2898705-
dc.author.googleYun, DJen_US
dc.author.googleRhee, SWen_US
dc.relation.volume155en_US
dc.relation.issue6en_US
dc.relation.startpageH357en_US
dc.relation.lastpageH362en_US
dc.contributor.id10052631en_US
dc.relation.journalJOURNAL OF THE ELECTROCHEMICAL SOCIETYen_US
dc.relation.indexSCI급, SCOPUS 등재논문en_US
dc.collections.nameJournal Papersen_US
dc.type.rimsART-
dc.identifier.bibliographicCitationJOURNAL OF THE ELECTROCHEMICAL SOCIETY, v.155, no.6, pp.H357 - H362-
dc.identifier.wosid000255524100050-
dc.date.tcdate2019-01-01-
dc.citation.endPageH362-
dc.citation.number6-
dc.citation.startPageH357-
dc.citation.titleJOURNAL OF THE ELECTROCHEMICAL SOCIETY-
dc.citation.volume155-
dc.contributor.affiliatedAuthorRhee, SW-
dc.identifier.scopusid2-s2.0-43049125159-
dc.description.journalClass1-
dc.description.journalClass1-
dc.description.wostc13-
dc.description.scptc13*
dc.date.scptcdate2018-10-274*
dc.type.docTypeArticle-
dc.subject.keywordPlusSURFACE-
dc.subject.keywordPlusMO-
dc.subject.keywordPlusTRANSISTORS-
dc.subject.keywordPlusDEPOSITION-
dc.subject.keywordPlusDIOXIDE-
dc.subject.keywordPlusSILICON-
dc.subject.keywordPlusOXIDES-
dc.subject.keywordPlusCARBON-
dc.subject.keywordPlusGATE-
dc.relation.journalWebOfScienceCategoryElectrochemistry-
dc.relation.journalWebOfScienceCategoryMaterials Science, Coatings & Films-
dc.description.journalRegisteredClassscie-
dc.description.journalRegisteredClassscopus-
dc.relation.journalResearchAreaElectrochemistry-
dc.relation.journalResearchAreaMaterials Science-

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