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dc.contributor.authorKim, Yulhwa-
dc.contributor.authorKim, Hyungjun-
dc.contributor.authorPark, Jihoon-
dc.contributor.authorOh, Hyunmyung-
dc.contributor.authorKim, Jae-Joon-
dc.date.accessioned2022-06-07T07:20:07Z-
dc.date.available2022-06-07T07:20:07Z-
dc.date.created2022-06-03-
dc.date.issued2021-02-03-
dc.identifier.urihttps://oasis.postech.ac.kr/handle/2014.oak/112804-
dc.description.abstractImplementing binary neural networks (BNNs) on computing-in-memory (CIM) hardware has several attractive features such as small memory requirement and minimal overhead in peripheral circuits such as analog-to-digital converters (ADCs). On the other hand, one of the downsides of using BNNs is that it degrades the classification accuracy. Recently, ResNet-style BNNs are gaining popularity with higher accuracy than conventional BNNs. The accuracy improvement comes from the high-resolution skip connection which binary ResNets use to compensate the information loss caused by binarization. However, the high-resolution skip connection forces the CIM hardware to use high-bit ADCs again so that area and energy overhead becomes larger. In this paper, we demonstrate that binary ResNets can be also mapped on CIM with low-bit ADCs via aggressive partial sum quantization and input-splitting combined with retraining. As a result, the key advantages of BNN CIM such as small area and energy consumption can be preserved with higher accuracy.-
dc.languageEnglish-
dc.publisherInstitute of Electrical and Electronics Engineers Inc.-
dc.relation.isPartOf2021 Design, Automation and Test in Europe Conference and Exhibition, DATE 2021-
dc.relation.isPartOfProceedings -Design, Automation and Test in Europe, DATE-
dc.titleMapping Binary ResNets on Computing-In-Memory Hardware with Low-bit ADCs-
dc.typeConference-
dc.type.rimsCONF-
dc.identifier.bibliographicCitation2021 Design, Automation and Test in Europe Conference and Exhibition, DATE 2021, pp.856 - 861-
dc.citation.conferenceDate2021-02-01-
dc.citation.conferencePlaceKO-
dc.citation.endPage861-
dc.citation.startPage856-
dc.citation.title2021 Design, Automation and Test in Europe Conference and Exhibition, DATE 2021-
dc.contributor.affiliatedAuthorKim, Yulhwa-
dc.description.journalClass1-
dc.description.journalClass1-

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