DC Field | Value | Language |
---|---|---|
dc.contributor.author | Kim, Yulhwa | - |
dc.contributor.author | Kim, Hyungjun | - |
dc.contributor.author | Park, Jihoon | - |
dc.contributor.author | Oh, Hyunmyung | - |
dc.contributor.author | Kim, Jae-Joon | - |
dc.date.accessioned | 2022-06-07T07:20:07Z | - |
dc.date.available | 2022-06-07T07:20:07Z | - |
dc.date.created | 2022-06-03 | - |
dc.date.issued | 2021-02-03 | - |
dc.identifier.uri | https://oasis.postech.ac.kr/handle/2014.oak/112804 | - |
dc.description.abstract | Implementing binary neural networks (BNNs) on computing-in-memory (CIM) hardware has several attractive features such as small memory requirement and minimal overhead in peripheral circuits such as analog-to-digital converters (ADCs). On the other hand, one of the downsides of using BNNs is that it degrades the classification accuracy. Recently, ResNet-style BNNs are gaining popularity with higher accuracy than conventional BNNs. The accuracy improvement comes from the high-resolution skip connection which binary ResNets use to compensate the information loss caused by binarization. However, the high-resolution skip connection forces the CIM hardware to use high-bit ADCs again so that area and energy overhead becomes larger. In this paper, we demonstrate that binary ResNets can be also mapped on CIM with low-bit ADCs via aggressive partial sum quantization and input-splitting combined with retraining. As a result, the key advantages of BNN CIM such as small area and energy consumption can be preserved with higher accuracy. | - |
dc.language | English | - |
dc.publisher | Institute of Electrical and Electronics Engineers Inc. | - |
dc.relation.isPartOf | 2021 Design, Automation and Test in Europe Conference and Exhibition, DATE 2021 | - |
dc.relation.isPartOf | Proceedings -Design, Automation and Test in Europe, DATE | - |
dc.title | Mapping Binary ResNets on Computing-In-Memory Hardware with Low-bit ADCs | - |
dc.type | Conference | - |
dc.type.rims | CONF | - |
dc.identifier.bibliographicCitation | 2021 Design, Automation and Test in Europe Conference and Exhibition, DATE 2021, pp.856 - 861 | - |
dc.citation.conferenceDate | 2021-02-01 | - |
dc.citation.conferencePlace | KO | - |
dc.citation.endPage | 861 | - |
dc.citation.startPage | 856 | - |
dc.citation.title | 2021 Design, Automation and Test in Europe Conference and Exhibition, DATE 2021 | - |
dc.contributor.affiliatedAuthor | Kim, Yulhwa | - |
dc.description.journalClass | 1 | - |
dc.description.journalClass | 1 | - |
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