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Extended depth-of-field (EDOF) wide-field microscopy with a micro-mirror array lens system (MALS) for versatile in-situ cell examination
- Title
- Extended depth-of-field (EDOF) wide-field microscopy with a micro-mirror array lens system (MALS) for versatile in-situ cell examination
- Authors
- KIM, KI HEAN; JEON, SUIL; JIEUN, YUN
- Date Issued
- 2022-07-04
- Publisher
- 사단법인 한국광학회 (Optical Society of Korea)
- Article Type
- Conference
- Citation
- Optics and Photonics Congress 2022 (OPC 2022), 2022-07-04
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Related Researcher
- 김기현KIM, KI HEAN
- Dept of Mechanical Enginrg