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Time-Resolved Ultraviolet Near-Field Scanning Optical Microscope for Characterizing Photoluminescence Lifetime of Light-Emitting Devices SCIE SCOPUS
- Title
- Time-Resolved Ultraviolet Near-Field Scanning Optical Microscope for Characterizing Photoluminescence Lifetime of Light-Emitting Devices
- Authors
- Park, Kyoung-Duck; Jeong, Hyun; Kim, Yong Hwan; Yim, Sang-Youp; Lee, Hong Seok; Suh, Eun-Kyung; Jeong, Mun Seok
- Date Issued
- 2013-03
- Publisher
- American Scientific Publishers
- Abstract
- We developed a instrument consisting of an ultraviolet (UV) near-field scanning optical microscope (NSOM) combined with time-correlated single photon counting, which allows efficient observation of temporal dynamics of near-field photoluminescence (PL) down to the sub-wavelength scale. The developed time-resolved UV NSOM system showed a spatial resolution of 110 nm and a temporal resolution of 130 ps in the optical signal. The proposed microscope system was successfully demonstrated by characterizing the near-field PL lifetime of InGaN/GaN multiple quantum wells.
- ISSN
- 1533-4880
- Article Type
- Article
- Citation
- Journal of Nanoscience and Nanotechnology, vol. 13, no. 3, page. 1798 - 1801, 2013-03
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- 박경덕PARK, KYOUNG DUCK
- Dept of Physics