Ultraviolet tip-enhanced nanoscale Raman imaging

Abstract

We have constructed an ultraviolet (UV)-apertureless near-field scanning optical microscope-Raman spectroscopy system by using an aluminum tip for the simultaneous measurement of topography and Raman scattering of nanomaterials with high spatial resolution. The topography, Rayleigh scattering image, and tip-enhanced Raman scattering image of the carbon nanotube film showed that a spatial resolution of around 19?nm was achieved. This spatial resolution of UV-Raman mapping image exceeds that of previous approaches, which have several hundred nanometers of spatial resolution. Copyright (c) 2012 John Wiley & Sons, Ltd.