Characterization of carbon nano-materials by apertureless near-field scanning optical microscope-Raman spectroscopy

Abstract

In this study, an apertureless near-field scanning optical microscope-Raman spectroscopy system is constructed and the topography and Raman scattering image of carbon nano-materials are simultaneously measured with high spatial resolution by using a sharp Au tip. The Rayleigh scattering image, and Raman scattering image of the carbon nanotubes showed improved spatial resolution and enhanced scattering intensity owing to the optical antenna effect of Au tip.