Conference
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| DC Field | Value | Language |
|---|---|---|
| dc.contributor.author | KIM, JU YEONG | - |
| dc.contributor.author | BAE, YOUNG MOK | - |
| dc.contributor.author | CHOI, SEUNG HYUN | - |
| dc.contributor.author | KIM, KWANG JAE | - |
| dc.date.accessioned | 2023-02-20T05:21:01Z | - |
| dc.date.available | 2023-02-20T05:21:01Z | - |
| dc.date.created | 2023-02-20 | - |
| dc.date.issued | 2022-11-04 | - |
| dc.identifier.uri | https://oasis.postech.ac.kr/handle/2014.oak/115294 | - |
| dc.publisher | 대한산업공학회 | - |
| dc.relation.isPartOf | 2022 대한산업공학회 추계학술대회 | - |
| dc.title | 웨이퍼 내 칩 간 공간적 유사성과 검사항목 간 상관관계를 고려한 반도체 웨이퍼 테스트 데이터의 결측치 대체 방법 개발 | - |
| dc.type | Conference | - |
| dc.type.rims | CONF | - |
| dc.identifier.bibliographicCitation | 2022 대한산업공학회 추계학술대회 | - |
| dc.citation.conferenceDate | 2022-11-04 | - |
| dc.citation.conferencePlace | KO | - |
| dc.citation.title | 2022 대한산업공학회 추계학술대회 | - |
| dc.contributor.affiliatedAuthor | KIM, JU YEONG | - |
| dc.contributor.affiliatedAuthor | BAE, YOUNG MOK | - |
| dc.contributor.affiliatedAuthor | CHOI, SEUNG HYUN | - |
| dc.contributor.affiliatedAuthor | KIM, KWANG JAE | - |
| dc.description.journalClass | 2 | - |
| dc.description.journalClass | 2 | - |
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Related Researcher
- 김광재KIM, KWANG JAE
- Dept. of Industrial & Management Eng.