Conference
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| DC Field | Value | Language |
|---|---|---|
| dc.contributor.author | CHOI, SEUNG HYUN | - |
| dc.contributor.author | KIM, EUN SU | - |
| dc.contributor.author | LEE, DONG HEE | - |
| dc.contributor.author | BAE, YOUNG MOK | - |
| dc.contributor.author | HWANG, CHAN HO | - |
| dc.contributor.author | OH, YOUNG CHAN | - |
| dc.contributor.author | KIM, KWANG JAE | - |
| dc.date.accessioned | 2023-02-20T05:23:25Z | - |
| dc.date.available | 2023-02-20T05:23:25Z | - |
| dc.date.created | 2023-02-20 | - |
| dc.date.issued | 2020-11-13 | - |
| dc.identifier.uri | https://oasis.postech.ac.kr/handle/2014.oak/115313 | - |
| dc.language | Korean | - |
| dc.publisher | 대한산업공학회 | - |
| dc.relation.isPartOf | 2020 대한산업공학회 추계학술대회 | - |
| dc.title | 공간 차원 기반의 wafer bin map 불량 패턴 분류체계 개발 | - |
| dc.type | Conference | - |
| dc.type.rims | CONF | - |
| dc.identifier.bibliographicCitation | 2020 대한산업공학회 추계학술대회 | - |
| dc.citation.conferenceDate | 2020-11-13 | - |
| dc.citation.conferencePlace | KO | - |
| dc.citation.title | 2020 대한산업공학회 추계학술대회 | - |
| dc.contributor.affiliatedAuthor | CHOI, SEUNG HYUN | - |
| dc.contributor.affiliatedAuthor | KIM, KWANG JAE | - |
| dc.description.journalClass | 2 | - |
| dc.description.journalClass | 2 | - |
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Related Researcher
- 김광재KIM, KWANG JAE
- Dept. of Industrial & Management Eng.