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dc.contributor.authorLee, Jaeseo-
dc.contributor.authorKim, Sangki-
dc.contributor.authorBae, Kyungmin-
dc.date.accessioned2023-02-27T04:40:33Z-
dc.date.available2023-02-27T04:40:33Z-
dc.date.created2023-02-27-
dc.date.issued2022-12-07-
dc.identifier.urihttps://oasis.postech.ac.kr/handle/2014.oak/115762-
dc.description.abstractA programmable logic controller (PLC) is widely used in industrial control systems, and Structured text (ST) is an imperative language to develop PLC programs. Because of its safety-critical nature, formally analyzing PLC programs is important, and a rewriting-based formal semantics of ST has been proposed for this purpose. This paper presents a bounded model checking technique for PLC ST programs based on the rewriting-based semantics. We apply rewriting modulo SMT to symbolically analyze LTL properties of ST programs with respect to sequences of (possibly infinite) inputs and outputs. We have demonstrated the effectiveness of our approach using a traffic light case study.-
dc.languageEnglish-
dc.publisherAssociation for Computing Machinery, Inc-
dc.relation.isPartOf8th ACM SIGPLAN International Workshop on Formal Techniques for Safety-Critical Systems, FTSCS 2022, co-located with the ACM SIGPLAN Conference on-
dc.relation.isPartOfFTSCS 2022 - Proceedings of the 8th ACM SIGPLAN International Workshop on Formal Techniques for Safety-Critical Systems, co-located with SPLASH 2022-
dc.titleBounded Model Checking of PLC ST Programs using Rewriting Modulo SMT-
dc.typeConference-
dc.type.rimsCONF-
dc.identifier.bibliographicCitation8th ACM SIGPLAN International Workshop on Formal Techniques for Safety-Critical Systems, FTSCS 2022, co-located with the ACM SIGPLAN Conference on, pp.56 - 67-
dc.citation.conferenceDate2022-12-07-
dc.citation.conferencePlaceNZ-
dc.citation.endPage67-
dc.citation.startPage56-
dc.citation.title8th ACM SIGPLAN International Workshop on Formal Techniques for Safety-Critical Systems, FTSCS 2022, co-located with the ACM SIGPLAN Conference on-
dc.contributor.affiliatedAuthorLee, Jaeseo-
dc.contributor.affiliatedAuthorKim, Sangki-
dc.contributor.affiliatedAuthorBae, Kyungmin-
dc.description.journalClass1-
dc.description.journalClass1-

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