Conference
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| DC Field | Value | Language |
|---|---|---|
| dc.contributor.author | LEE, BYOUNG HUN | - |
| dc.date.accessioned | 2023-03-03T02:24:35Z | - |
| dc.date.available | 2023-03-03T02:24:35Z | - |
| dc.date.created | 2023-03-03 | - |
| dc.date.issued | 2021-03-23 | - |
| dc.identifier.uri | https://oasis.postech.ac.kr/handle/2014.oak/116509 | - |
| dc.language | English | - |
| dc.publisher | IEEE | - |
| dc.relation.isPartOf | IRPS 2021 | - |
| dc.title | Drastic reliability improvement using H2O2/UV treatment of HfO2 for heterogeneous integration | - |
| dc.type | Conference | - |
| dc.type.rims | CONF | - |
| dc.identifier.bibliographicCitation | IRPS 2021 | - |
| dc.citation.conferenceDate | 2021-03-21 | - |
| dc.citation.conferencePlace | US | - |
| dc.citation.title | IRPS 2021 | - |
| dc.contributor.affiliatedAuthor | LEE, BYOUNG HUN | - |
| dc.description.journalClass | 1 | - |
| dc.description.journalClass | 1 | - |
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