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dc.contributor.authorArshad, Asma-
dc.contributor.authorAzam, Muhammad-
dc.contributor.authorAslam, Muhammad-
dc.contributor.authorJun, Chi-Hyuck-
dc.date.accessioned2023-07-11T01:46:52Z-
dc.date.available2023-07-11T01:46:52Z-
dc.date.created2022-07-04-
dc.date.issued2022-01-
dc.identifier.issn0361-0926-
dc.identifier.urihttps://oasis.postech.ac.kr/handle/2014.oak/117929-
dc.description.abstract© 2022 Taylor & Francis Group, LLC.In this paper, an attempt is made to develop a new variable control chart under the resubmitted sampling scheme. The resubmission of a sample allows retaking a sample to pass through inspection/analyzing if there is a question on the inspection of the sample at any stage. The proposed control chart includes the X-bar chart as a special case. The performance of the proposed control chart is assessed by determining the in-control and out-of-control average run lengths for the various parametric settings. For illustrative purposes, a real-life example is presented to explain a detailed implementation of the proposed control chart.-
dc.languageEnglish-
dc.publisherTaylor and Francis Ltd.-
dc.relation.isPartOfCommunications in Statistics - Theory and Methods-
dc.titleA resubmission-based variable control chart-
dc.typeArticle-
dc.identifier.doi10.1080/03610926.2022.2087880-
dc.type.rimsART-
dc.identifier.bibliographicCitationCommunications in Statistics - Theory and Methods-
dc.identifier.wosid000812100300001-
dc.citation.titleCommunications in Statistics - Theory and Methods-
dc.contributor.affiliatedAuthorJun, Chi-Hyuck-
dc.identifier.scopusid2-s2.0-85132389268-
dc.description.journalClass1-
dc.description.journalClass1-
dc.description.isOpenAccessN-
dc.type.docTypeArticle; Early Access-
dc.subject.keywordAuthoraverage run length-
dc.subject.keywordAuthorresubmitted sampling-
dc.subject.keywordAuthorStatistical quality control-
dc.subject.keywordAuthorvariable control chart-
dc.relation.journalWebOfScienceCategoryStatistics & Probability-
dc.description.journalRegisteredClassscie-
dc.description.journalRegisteredClassscopus-

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전치혁JUN, CHI HYUCK
Dept of Industrial & Management Enginrg
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